• Event

    CIM 2017: 18th International Metrology Congress

    The CIM 2017 will be held from 19 to 21 September in Paris with ENOVA Technology Show.
    The congress deals with R&D and best practices for Measurement and Metrology in industry through: Oral and Posters presentations, Round tables and an exhibition showcasing innovations and measurement's professionnals.

    Find the topics for this new edition and receive the programme in April!

  • CIM 2017: 18th International Metrology Congress