CONFERENCE ON ADVANCED MATHEMATICAL AND COMPUTATIONAL TOOLS
IN METROLOGY AND TESTING
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ENS Cachan Paris, France, 23-25 June, 2008 organised by: IMEKO TC21 “Advanced Mathematical Tools for Measurements”* and CFM “Collège Français de Métrologie” |
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The VIII AMCTM Conference will be held in Paris, organised by the Collège Français de Métrologie (www.cfmetrologie.com) jointly with IMEKO TC21 (www.imeko.org)*. Following the first workshop held in Torino (1993), conferences were held in Oxford (1995, 1999), Berlin (1996) and Lisboa (2000) (supported by the European Union EuroConferences programme) and in Torino (2003) and Lisboa (2005) (supported by the EU Network SofTools_Metronet), and led to seven volumes on Advanced Mathematical and Computational Tools in Metrology published by World Scientific www.wspc.com. Volumes contents can be found at www.amctm.org.
Chairpersons: Franco Pavese (President TC21, INRIM, Italy), Jean-Marc Linares(CFM representive with TC21, Aix-Marseille II University, France),
International Scientific Programme Committee:
European Chapter: European Chapter: Franco Pavese, Alistair Forbes (scientific secretary IMEKO TC21, NPL, UK), Jean-Marc Linares, Markus Bär (PTB, Germany), Eric Benoit (scientific secretary IMEKO TC7 and Université de Savoie, France), Wolfram Bremser (BAM, Germany), Patrizia Ciarlini (CNR-IAC, Italy), Eduarda Filipe (IPQ, Portugal), Nicolas Fischer (LNE, France), Leslie Pendrill (SP, Sweden), Christophe Perruchet (UTAC, France and chairperson ISO TC69), Carlo Ferrero (chairperson IMEKO TC8, INRIM, Italy).
International Chapter:Isao Kishimoto (NMIJ-AIST, Japan), Alan Steele (NRC-CNRC, Canada), Nien Fan Zhang (NIST, USA).
Scientific Secretary : Jean-Marc Linares.
Conference Secretariat : Sandrine Gazal (Collège Français de Métrologie, France).
For information : info@cfmetrologie.com, jean-marc.linares@univmed.fr, f.pavese@inrim.it
- To present and promote reliable and effective mathematical and computational tools in metrology;
- To understand better the modelling, statistical and computational requirements in metrology;
- To provide a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources;
- To promote collaboration in the context of EU and International Programmes;
- To support young researchers in metrology and related fields, also through training;
- To address industrial requirements;
- To cover both fields of calibration and testing.
Topics for 2008 Conference
The main theme of the conference, reinforced by the establishment of IMEKO TC21, is to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and the software engineers working in the relevant fields.
The 2008 conference will deliver the following topics in thematic sessions:
Note: Uncertainty evaluation underpins all themes
- Fundamentals in measurement
- Written standards for metrology and testing
- Industrial statistic and Metrological traceability
- Health, Chemical and environmental metrology and testing
- Dynamic measurements
- Modelling and inverse problems in metrology
- Measurement software and internet metrology
- Key comparisons
- Metrology, calibration and testing
Conference format
AMCTM VIII will have plenary sessions and two parallel sessions. Oral presentations can add a poster augmenting the oral presentation. A dedicated poster session and a Round Table discussion are completing the programme.
Poster presentations, displayed since the morning of the first day, remain in show for the rest of the Conference, so they can be discussed during all the Conference breaks.
The provisional Conference Programme can be download here. (New version dated June 10)
An open meeting of IMEKO Technical committee TC21 will take place on Wednesday afternoon.
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Authors intending to contribute are invited to submit a one to two A4 page abstract to the Conference Scientific Secretary, in the MS Word or LaTeX style that can be found for the 9.00”x6.00” book format under www.worldscientific.com/style/proceedings_style.shtml, for review by the International Programme Committee.
Send mandatory by e-mail to: info@cfmetrologie.com with subject “AMCTM2008 abstract” (optional: additional postal shipment to the address below) Reception and acceptance of the abstracts will be confirmed by e-mail.
Authors of accepted papers are asked to submit the full manuscript (invited 12 pages, oral 6 pages, poster 4 pages) at the Conference within its end. Manuscripts should be prepared in MS Word or LaTeX, without exception according to the style that can be found for the 9.00”x6.00” book format under www.worldscientific.com/style/proceedings_style.shtml.
Following peer review, the selected submitted papers will be published in the book ”Advanced Mathematical and Computational Tools in Metrology VIII” (World Scientific, Singapore). An accompanying CD-ROM will in addition include all submitted papers.
Venue
The AMCTM 2008 Conference will be held in ENS Cachan University, Paris, Université de ENS in Cachan (Paris Suburb)
For more information about the venue visit the website
http://www.ens-cachan.fr/english_version/contact.html and http://www.ens-cachan.fr
Registration
The normal registration fee for the three-day Conference is € 360(discounts are available to IMEKO TC21 members/friends –max 2 persons per member Institution and 1 per friend Institution).
It includes taxes, coffee breaks, lunch (Monday and Tuesday), Abstract Booklet and one copy of the book AMCTM VIII with the accompanying CD-ROM.
Registration form here
Accommodation
A list of hotels closer to the venue can be found here.
Each participant has to arrange his/her own hotel accomodation.
AMCTM 2008 Organisation: |
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Scientific Secretary: J-M. Linares, Université Aix-Marseille II jean-marc.linares@univmed.fr |
AMCTM 2008 Chairpersons:
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Conference Administration: Sandrine Gazal Tel: 33 4 67 06 20 36 Fax: 33 4 67 06 20 35 info@cfmetrologie.com |
Conference address: |
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